• DocumentCode
    3503402
  • Title

    Development of a Petri net-based fault diagnostic system for industrial processes

  • Author

    Lee, Jin-Shyan ; Chuang, Chun-Chieh

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    4347
  • Lastpage
    4352
  • Abstract
    For the improvement of the reliability and safety of industrial processes, a fault detection and tracing approach has been proposed. In this paper, the P-invariant of Petri nets (PN) is applied to discover sequence faults, while both sensor faults and actuator faults are detected using exclusive logic functions. For industrial applications, the proposed fault detector has been implemented within a programmable logic controller (PLC) by converting the fault detection logic functions into ladder logic diagrams (LLD). Moreover, a fault tracer has been modeled by an AND/OR tree and a tracing procedure is provided to locate the faults. A mark stamping process is demonstrated as an example to illustrate the proposed diagnostic approach.
  • Keywords
    Petri nets; fault location; manufacturing systems; programmable controllers; reliability; safety; AND/OR tree; P-invariant; Petri net; actuator fault; fault detection; fault diagnostic system; fault location; fault tracing; industrial process; ladder logic diagram; logic function; mark stamping; programmable logic controller; reliability; safety; sensor fault; sequence fault; Actuators; Application software; Discrete event systems; Electrical safety; Fault detection; Logic functions; Manufacturing systems; Monitoring; Petri nets; Programmable control; Fault diagnostic systems; P-invariant; Petri nets (PN); discrete event systems; programmable logic controllers (PLC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5414911
  • Filename
    5414911