DocumentCode
3503402
Title
Development of a Petri net-based fault diagnostic system for industrial processes
Author
Lee, Jin-Shyan ; Chuang, Chun-Chieh
Author_Institution
Dept. of Electr. Eng., Nat. Taipei Univ. of Technol., Taipei, Taiwan
fYear
2009
fDate
3-5 Nov. 2009
Firstpage
4347
Lastpage
4352
Abstract
For the improvement of the reliability and safety of industrial processes, a fault detection and tracing approach has been proposed. In this paper, the P-invariant of Petri nets (PN) is applied to discover sequence faults, while both sensor faults and actuator faults are detected using exclusive logic functions. For industrial applications, the proposed fault detector has been implemented within a programmable logic controller (PLC) by converting the fault detection logic functions into ladder logic diagrams (LLD). Moreover, a fault tracer has been modeled by an AND/OR tree and a tracing procedure is provided to locate the faults. A mark stamping process is demonstrated as an example to illustrate the proposed diagnostic approach.
Keywords
Petri nets; fault location; manufacturing systems; programmable controllers; reliability; safety; AND/OR tree; P-invariant; Petri net; actuator fault; fault detection; fault diagnostic system; fault location; fault tracing; industrial process; ladder logic diagram; logic function; mark stamping; programmable logic controller; reliability; safety; sensor fault; sequence fault; Actuators; Application software; Discrete event systems; Electrical safety; Fault detection; Logic functions; Manufacturing systems; Monitoring; Petri nets; Programmable control; Fault diagnostic systems; P-invariant; Petri nets (PN); discrete event systems; programmable logic controllers (PLC);
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
Conference_Location
Porto
ISSN
1553-572X
Print_ISBN
978-1-4244-4648-3
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2009.5414911
Filename
5414911
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