DocumentCode
3503595
Title
Evaluating sampling strategies of dermoscopic interest points
Author
Situ, Ning ; Wadhawan, Tarun ; Hu, Rui ; Lancaster, Keith ; Yuan, Xiaojing ; Zouridakis, George
Author_Institution
Depts. of Comput. Sci., Univ. of Houston, Houston, TX, USA
fYear
2011
fDate
March 30 2011-April 2 2011
Firstpage
109
Lastpage
112
Abstract
Among the most critical components of a computerized system for automated melanoma detection is image sampling and pooling of the extracted features. In this paper, we propose a new method for sampling and pooling based on a combination of spatial pooling and graph theory features. The performance of the new method is evaluated using a dataset of more than 1,500 images representing pigmented skin lesions of known pathology. In our comparisons, we include several methods ranging from simple and multi-scale sampling on a regular grid to more sophisticated approaches, such as blob and curvilinear structure detectors. Our results show that, despite its simplicity, simple sampling on a regular grid provides highly competitive performance, compared to the more sophisticated approaches, while multi-scale sampling yields only trivial improvements. However, the proposed method provides significant performance improvement in terms of sensitivity and area under the receiver operating characteristic curve (95% t-test), and the best performance in terms of specificity compared to all other methods explored.
Keywords
biomedical optical imaging; cancer; graph theory; image sampling; medical image processing; skin; automated melanoma detection; dermoscopic interest points; extracted feature pooling; graph theory features; image sampling; pathology; pigmented skin lesions; regular grid; sampling strategies; spatial pooling; Cancer; Detectors; Feature extraction; Lesions; Malignant tumors; Pixel; Sensitivity; Image classification; dermoscopic image; interest point detection; pigmented skin lesion;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1945-7928
Print_ISBN
978-1-4244-4127-3
Electronic_ISBN
1945-7928
Type
conf
DOI
10.1109/ISBI.2011.5872366
Filename
5872366
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