• DocumentCode
    3504014
  • Title

    Metallic nanowires grown via field-emission induced growth as electron sources

  • Author

    Thong, J.T.L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Single metallic nanowires can be grown from a cold field emission tip in the presence of a precursor, such as an organometallic compound. Electron emission from the newly grown nanowire tip continues the growth and can yield nanowires with lengths ranging from tens of nm to even hundreds of microns depending on the growth time. This approach of Field-Emission-Induced Growth (FEIG) has been used for various applications, including nanowire interconnects, scanning-probe tips, and in particular, as field-emission sources. This paper briefly describes the growth methodology and mechanism, and the characteristics of the material thus derived. Ultrathin tungsten nanowires of 5 nm in diameter and several hundred nm length have been characterized for their potential as a field emitter. After flashing, cold-field-emission current stability with standard deviation of better than 1% has been observed at vacuum levels of ~10-9 mbar. The properties of such field emitters, and the reasons underlying the performance are discussed.
  • Keywords
    electron field emission; electron sources; interconnections; nanowires; tungsten; FEIG approach; cold field emission tip; cold-field-emission current stability; electron sources; field-emission induced growth approach; field-emission sources; nanowire interconnects; organometallic compound; scanning-probe tips; single metallic nanowires; size 5 nm; ultrathin tungsten nanowires; Carbon; Carbon dioxide; Cathodes; Materials; Microscopy; Nanowires; Tungsten; field emission; field-emission induced growth; nanowires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316870
  • Filename
    6316870