DocumentCode :
3504017
Title :
Stability study of thick-film pressure sensor on steel substrate
Author :
Zongyang Zhang ; Xingguo Cheng ; Run Chen ; Xiaojie Chen ; Sheng Liu
Author_Institution :
State Key Lab. for Digital Manuf. Equip. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2012
fDate :
13-16 Aug. 2012
Firstpage :
625
Lastpage :
629
Abstract :
Thick-film pressure sensors on steel substrate are proven to be robust and low cost, and can be used in many fields such as automotive industries, oil industries and military sectors. In this paper, finite element method (FEM) was used to evaluate residual thermal stresses and the self-heating of the thick film resistors (TFRs) on the offset voltage of the sensor. Results show that the residual stresses will affect the sensor output stability and accelerate the failure of dielectrics on steel substrate. The effects of self-heating of TFRs on the offset voltage can be negligible. Certain accelerated environmental tests are used to evaluate the robustness, stability of the sensors. Results show that the sensors have a stable output at constant temperature of 25°C. Most sensors have a small offset change after thermal cycling. Although some sensors have a relatively large zero drift after thermal cycling, and this drift can be relieved by appropriate heat treatment. Finally, thermal shock test and drop test have verified the robust bonding between the dielectrics and the steel substrate.
Keywords :
circuit stability; dielectric devices; failure analysis; finite element analysis; heat treatment; integrated circuit bonding; integrated circuit testing; life testing; pressure sensors; steel; thermal management (packaging); thermal shock; thermal stresses; thick film resistors; FEM; TFR; accelerated environmental test; dielectrics; drop test; failure; finite element method; heat treatment; offset voltage; residual thermal stress; robust bonding; self-heating; sensor output stability; steel substrate; temperature 25 C; thermal cycling; thermal shock test; thick film resistor; thick-film pressure sensor; zero drift; Abstracts; Copper; Educational institutions; Heating; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4673-1682-8
Electronic_ISBN :
978-1-4673-1680-4
Type :
conf
DOI :
10.1109/ICEPT-HDP.2012.6474695
Filename :
6474695
Link To Document :
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