• DocumentCode
    3504022
  • Title

    Electron field emission from carbon nanotubes

  • Author

    Silva, S.R.P.

  • Author_Institution
    Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Technological advances in microfabrication has resulted in a renewed interest in vacuum microelectronics. The potential scatter-free ballistic motion of electrons in vacuum out-performs solid state scatter-dominated electron transport in many applications. Carbon nanotubes has been identified as a suitable source for cold cathodes, and a second generation technology for Spindt metal tips. This is enabled by the high aspect ratios, mechanical robustness, high current carrying capability and chemical inertness. There is a long held belief that CNTs will be an ideal material structure for high resolution electron beam instruments that use point electron sources. In addition, there are a number of other applications that can utilise CNT for technologies that range from field emission displays to X-ray sources to microwave amplifiers. Before CNTs can be adopted for technologies, routes to manufacture, with suitable quality and appropriate characteristics must be realised. Furthermore, the key application that allows the science to move into a technology product must be identified.
  • Keywords
    carbon nanotubes; cathodes; electron field emission; electron sources; field emission displays; microfabrication; microwave amplifiers; vacuum microelectronics; CNT; Spindt metal tips; X-ray sources; carbon nanotubes; chemical inertness; cold cathodes; electron field emission; field emission displays; high aspect ratios; high resolution electron beam instruments; ideal material structure; microfabrication; microwave amplifiers; point electron sources; potential scatter-free ballistic motion; second generation technology; solid state scatter-dominated electron transport; vacuum microelectronics; Carbon nanotubes; Cathodes; Chemicals; Electron emission; Materials; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316871
  • Filename
    6316871