• DocumentCode
    3504344
  • Title

    Theoretical investigations into the field enhancement factor of silicon structures

  • Author

    Langer, C. ; Prommesberger, C. ; Dams, F. ; Schreiner, R.

  • Author_Institution
    Fac. of Microsyst. Technol., Regensburg Univ. of Appl. Sci., Regensburg, Germany
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In order to optimize our field-emitting silicon structures, the influence of geometric parameters like aspect ratio, aperture angle and curvature on the field enhancement factor was investigated by finite element simulations. A universal geometric model consisting of a rounded triangle and elliptic curvatures was taken for modeling a variety of different silicon tip as well as ridge structures. Whereas, a high dependency of the field enhancement on the aperture angle was found, the simulations show that the elliptic curvature affects the field enhancement only marginal.
  • Keywords
    elemental semiconductors; field emitter arrays; finite element analysis; silicon; Si; aperture angle; aspect ratio; elliptic curvatures; field enhancement factor curvature; field-emitting silicon structures; finite element simulations; ridge structures; rounded triangle curvatures; silicon field emitter array; silicon tip; universal geometric model; Apertures; Electric fields; Equations; Finite element methods; Mathematical model; Shape; Silicon; field enhancement factor; silicon field emitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316886
  • Filename
    6316886