• DocumentCode
    3504353
  • Title

    Electron-impact excitation of xenon

  • Author

    Dasgupta, Avirup ; Bartschat, K. ; Madison, D.

  • Author_Institution
    Div. of Plasma Phys., Naval Res. Lab., Washington, DC, USA
  • fYear
    2004
  • fDate
    1-1 July 2004
  • Firstpage
    234
  • Abstract
    Summary form only given. We present theoretical results from multi-state R-matrix (close-coupling) and two different distorted-wave calculations for electron-impact excitation from the ground and excited states to the fine-structure levels of the 5p/sup 5/6s, 5p/sup 5/6p, and 5p/sup 5/5d configurations in Xe I. The results obtained for similar calculations in Ar I and Kr I for some transitions were found to be extremely sensitive to the theoretical model for both the collision process and the target structure. An analysis of the dependence of the results on the details of the theoretical model, particularly on the structure description and the number of coupled states is presented and the results obtained are compared with available predictions as well as experimental data. This investigation not only reveals many interesting aspects of basic physics of atomic collisions, but it is extremely important for many gaseous electronics applications such as lighting and plasma technologies. In particular, results from this study are used to model an electron beam pumped Ar-Xe laser at NRL.
  • Keywords
    argon; atom-electron collisions; electron beam pumping; electron impact excitation; excited states; fine structure; gas lasers; ground states; matrix algebra; xenon; Xe; Xe-Ar; atomic collision; collision process; coupled states; distorted-wave calculations; electron beam pumped Ar-Xe laser; electron-impact excitation; excited states; fine-structure levels; ground states; Argon; Atomic beams; Coupled mode analysis; Electron beams; Gas lasers; Laser excitation; Physics; Plasma applications; Predictive models; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-8334-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.2004.1339849
  • Filename
    1339849