• DocumentCode
    3504390
  • Title

    Image fusion for following-up brain tumor evolution

  • Author

    Ruan, Su ; Zhang, Nan ; Liao, Qingmin ; Zhu, Yuemin

  • Author_Institution
    LITIS-Quantif, Univ. de Rouen, Rouen, France
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    281
  • Lastpage
    284
  • Abstract
    This paper presents a feature-selection-based data fusion method to follow up the evolution of brain tumors under therapeutic treatments with multi-spectral MRI data sequences. The fusion of MRI data is proposed to use a feature selection method to choose the most important features to classify tumor tissues and non-tumor tissues. Our system consists of three steps for each MRI examination (one examination per four months): feature selection, SVM-based segmentation, and contour refinement. The training of the tumor is carried out only on the first MRI examination (before the treatment). Six feature selection methods are tested in our system. The quantitative comparisons of the methods´ and the expert´s manual traces demonstrate the effectiveness of the fusion by the feature selection. Results of following-up three patients over one year show that our system can provide a good tool to evaluate the therapeutic treatment.
  • Keywords
    biomedical MRI; brain; feature extraction; image classification; image fusion; image segmentation; image sequences; learning (artificial intelligence); medical image processing; patient treatment; tumours; SVM; brain tumor evolution; data fusion; data sequences; feature selection; image fusion; multispectral MRI; nontumor tissues; segmentation; therapeutic treatment; tumor tissues; Feature extraction; Image segmentation; Kernel; Magnetic resonance imaging; Principal component analysis; Support vector machines; Tumors; Support Vector Machine (SVM); feature selection; follow-up system; image fusion; tumor segmentation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872406
  • Filename
    5872406