• DocumentCode
    3504425
  • Title

    Thermal analysis and heat dissipation optimization of 3D packaging with TSV interposer

  • Author

    He Ma ; Daquan Yu ; Jun Wang

  • Author_Institution
    Inst. of Microelectron., Beijing, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    700
  • Lastpage
    705
  • Abstract
    In this paper, the finite element method (FEM) was used to simulate the thermal conduction in 2.5D IC integration with TSV (Through Silicon Via) interposer. The focus of the research is on the determination of the contributing factors and their effect on the temperature and heat distribution of the package. First, the steady thermal conduction of the package integrated with a chip power of 8W was computed with the initial design parameters. And then the relationship between the maximum temperature in the package and the chip power was investigated. The analysis illustrated that the thermal conductivity of EMC (Epoxy Molding Compound), BT substrate,under fill and the thickness of EMC are crucial for heat conduction in the package. Second, the parametric studies were performed to identify the effects of different parameters. Furthermore, the hot spot was analyzed and discussed. Also, a case for optimization for the design of heat dissipation was demonstrated and the guideline for thermal design for 2.5D integration was proposed.
  • Keywords
    cooling; finite element analysis; heat conduction; integrated circuit design; integrated circuit packaging; moulding; temperature distribution; three-dimensional integrated circuits; 2.5D IC integration; 3D packaging; BT substrate; EMC thermal conductivity; EMC thickness; FEM; TSV interposer; chip power; design parameters; epoxy molding compound; finite element method; heat conduction; heat dissipation optimization; steady thermal conduction; temperature distribution; thermal analysis; thermal conduction; thermal design; through silicon via interposer; under fill; Abstracts; Electromagnetic compatibility; Finite element methods; Substrates; Through-silicon vias;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474714
  • Filename
    6474714