Development of durable carbon field emission nanostructures for vacuum electronics

Author

Aban´shin, N.P. ; Gorfinkel, B.I. ; Yakunin, A.N.

Author_Institution

Volga-Svet Co. Ltd., Saratov, Russia

fYear

2012

fDate

9-13 July 2012

Firstpage

1

Lastpage

2

Abstract

The results achieved in improving the reliability and durability of cathodes based on field-induced electron emission of nano-scaled carbon structures are discussed. The features of the construction of two types of emitters: using carbon nanotubes (CNTs) and carbon-based planar-edge structures (CPES) - are described. The effective density of field emission current of 1.4 A·cm^-2- and longevity of the emitter at least 2000 hours were achieved experimentally. Promising directions in the development of microwave devices for communications and radar systems in the frequency range up to terahertz based on field emission structures are discussed.

Keywords

carbon nanotubes; cathodes; current density; durability; electron field emission; reliability; vacuum microelectronics; CNT; CPES; carbon-based planar-edge structures; communication systems; durable carbon field emission nanostructures; field emission current density; field emission structures; field-induced electron emission; microwave devices; nanoscaled carbon structures; radar systems; reliability; vacuum electronics; Anodes; Carbon nanotubes; Cathodes; Current density; Electric potential; Logic gates; CNT; carbon; field emission; nanostructure;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference (IVNC), 2012 25th International

Conference_Location

Jeju

ISSN

pending

Print_ISBN

978-1-4673-1983-6

Electronic_ISBN

pending

Type

conf

DOI

10.1109/IVNC.2012.6316901

Filename

6316901