DocumentCode
3504727
Title
Solder constitutive models and failure criteria selection in board level cyclic bending simulation
Author
Xiaoqing Li ; Xingming Fu ; Minyi Lou ; Jianwei Zhou ; Maohua Du ; Myungkee Chung
Author_Institution
Samsung Semicond. (China) R&D Co., Ltd., Suzhou, China
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
788
Lastpage
793
Abstract
Board level bending testing is an effective method to evaluate the solder joint reliability of handheld products. In this work, the solder joints failure mode during cyclic bending was characterized by a board level bending test system with respect to strain range and strain rate. And then the finite element modeling and simulation was conducted to investigate the solder joints reliability by considering different solder constitutive models and different failure criteria. The Elastic-plastic, Creep and Viscoplastic models of solder alloy were measured and input to finite element model to compare their effect on the simulation results of solder joint performance. In addition to solder constitutive model selection, failure criteria for solder joint reliability were discussed in this paper. Stress, plastic strain and plastic work were calculated in simulation and discussed. Base on comparing the actual experimental results and simulation results, it was concluded that the proposed solder constitutive model, Viscoplastic model is the appropriate model which can be used successfully to simulate the failure mechanism of solder joints under cyclic bending condition. The plastic strain was selected as the failure criteria for evaluating the solder joints reliability during cyclic bending simulation.
Keywords
bending; chip scale packaging; creep; elasticity; failure analysis; finite element analysis; printed circuit testing; reliability; soldering; viscoplasticity; board level cyclic bending simulation; creep model; elastic-plastic model; failure criteria selection; finite element modeling; solder constitutive model selection; solder joint reliability; strain range; strain rate; viscoplastic model; Abstracts; Creep; Displacement measurement; Integrated circuit modeling; Load modeling; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474730
Filename
6474730
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