• DocumentCode
    3504727
  • Title

    Solder constitutive models and failure criteria selection in board level cyclic bending simulation

  • Author

    Xiaoqing Li ; Xingming Fu ; Minyi Lou ; Jianwei Zhou ; Maohua Du ; Myungkee Chung

  • Author_Institution
    Samsung Semicond. (China) R&D Co., Ltd., Suzhou, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    788
  • Lastpage
    793
  • Abstract
    Board level bending testing is an effective method to evaluate the solder joint reliability of handheld products. In this work, the solder joints failure mode during cyclic bending was characterized by a board level bending test system with respect to strain range and strain rate. And then the finite element modeling and simulation was conducted to investigate the solder joints reliability by considering different solder constitutive models and different failure criteria. The Elastic-plastic, Creep and Viscoplastic models of solder alloy were measured and input to finite element model to compare their effect on the simulation results of solder joint performance. In addition to solder constitutive model selection, failure criteria for solder joint reliability were discussed in this paper. Stress, plastic strain and plastic work were calculated in simulation and discussed. Base on comparing the actual experimental results and simulation results, it was concluded that the proposed solder constitutive model, Viscoplastic model is the appropriate model which can be used successfully to simulate the failure mechanism of solder joints under cyclic bending condition. The plastic strain was selected as the failure criteria for evaluating the solder joints reliability during cyclic bending simulation.
  • Keywords
    bending; chip scale packaging; creep; elasticity; failure analysis; finite element analysis; printed circuit testing; reliability; soldering; viscoplasticity; board level cyclic bending simulation; creep model; elastic-plastic model; failure criteria selection; finite element modeling; solder constitutive model selection; solder joint reliability; strain range; strain rate; viscoplastic model; Abstracts; Creep; Displacement measurement; Integrated circuit modeling; Load modeling; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474730
  • Filename
    6474730