• DocumentCode
    3504761
  • Title

    Modyfying device structure for high emission current for x-ray tube application from triode-type carbon nanotube cathode

  • Author

    Jeong, Taewon ; KIM, Do-Yoon ; Park, Shanghyeun ; Kim, Ilhwan ; Kim, Yong Churl

  • Author_Institution
    Composite Mater. Group, Samsung Electron., Yongin, South Korea
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The triode-typed field emission (FE) devices using carbon nanotube (CNT) emitters for the x-ray application were fabricated. For the stability of the device, the leakage current between cathode and gate, and the emission current to the anode electrode should be controlled. We realized that the thickness of insulating layer-gap distance between cathode and gate- and the space between the gate electrodes-electron path from cathode and anode- should be controlled for the ratio of the current from cathode to anode (Ia) to the current from cathode to gate (Ig). The ratio of Ia to Ig can be represented the device efficiency. The rectangular-mesh electrode and screen printed insulating layer were controlled for Ia/Ig. When the size of gate hole was the 50 by 700 um - the electrode size is 25 by 700 um - and the thickness of insulator layer was 65 μm, the maximum ratio of Ia/(Ia+Ig) was 0.63.
  • Keywords
    X-ray tubes; carbon nanotubes; cathodes; electrodes; electron field emission; insulating materials; leakage currents; triodes; CNT emitters; FE devices; X-ray tube application; anode; anode electrode; device structure; gate electrode-electron path; high emission current; insulating layer-gap distance thickness; leakage current; rectangular-mesh electrode; screen printed insulating layer; size 65 mum; triode-type carbon nanotube cathode; triode-typed field emission devices; Anodes; Cathodes; Electric fields; Insulators; Iron; Logic gates; Ia/Ig; cartbon nanotube; field emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2012 25th International
  • Conference_Location
    Jeju
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-1983-6
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/IVNC.2012.6316905
  • Filename
    6316905