• DocumentCode
    3504898
  • Title

    The characteristics of current and voltage in an external electrode fluorescent lamp

  • Author

    Guangsup Cho ; Joo-Young Lee ; Dae-Heung Lee ; Sang-Beom Kim ; Je-Huan Koo ; Bong-Soo Kim ; June-Gill Kang ; Eun-Ha Choi ; Yang, S.C. ; Lee, U.W.

  • Author_Institution
    Dept. of Electrophys., Kwangwoon Univ., Seoul, South Korea
  • fYear
    2004
  • fDate
    1-1 July 2004
  • Firstpage
    251
  • Abstract
    Summary form only given. From the general I-V characteristics of EEFLs, the important issues in this study are to obtain the Townsend coefficients of the discharge, the ionization rate /spl alpha/ and the ion induced electron emission rate of the effective /spl gamma/ corresponding to EEFLs. The first coefficient is determined in the analysis of the dark current region. In this study the non-uniform field in cylindrical tube geometry is considered. Second, the range of gamma value was estimated. The EEFL discharge is the phenomena under the non-uniform electric field. In this experiment the dark current region shows the parameters A= 0.4/(cm torr) and B=71 volt/(cm torr) in the first Townsend coefficients. Townsend breakdown region having the second coefficient of /spl gamma/=0.57 shows the increasing of the current with the constant voltage about 1 kV. Finally, the normal glow region represents the behavior of the positive resistance in I-V.
  • Keywords
    Townsend discharge; electron emission; fluorescent lamps; glow discharges; 1 kV; I-V characteristics; Townsend breakdown region; Townsend discharge coefficients; current-voltage characteristics; cylindrical tube geometry; dark current region; external electrode fluorescent lamp; glow discharges; ion induced electron emission; ionization; Cathodes; Dark current; Electrodes; Fluorescent lamps; Frequency; Ionization; Light sources; Liquid crystal displays; Physics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-8334-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.2004.1339880
  • Filename
    1339880