The fundamental experiments x-ray imaging driven by electron beam

Author

Neo, Yoichiro ; Suzuki, Ryuji ; Aoki, Toru ; Mmimura, Hidenori

Author_Institution

Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan

fYear

2012

fDate

9-13 July 2012

Firstpage

1

Lastpage

2

Abstract

This report describes about the fundamental experimental results for x-ray imaging device which consists of a Schottky Cadmium Telluride (CdTe) diode and a scanning focused electron beam. It successfully demonstrated that the two kinds ways for reading out signal by electron beam. It was investigated in details about the output current dependencies of intensity and photon energy. 200μm stainless mesh in diameter was also detected by X-ray transmission image.

Keywords

II-VI semiconductors; Schottky diodes; X-ray imaging; cadmium compounds; electron beams; scanning electron microscopes; CdTe; Schottky cadmium telluride diode; X-ray transmission image; fundamental experiment X-ray imaging device; photon energy; scanning electron beam microscope; scanning focused electron beam; size 200 mum; stainless mesh; Electron beams; Electron tubes; Films; Photonics; Schottky diodes; Substrates; X-ray imaging; CdTe diode; Scanning electron beam microscope; Schottky X-ray; Secondary electron yield;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference (IVNC), 2012 25th International

Conference_Location

Jeju

ISSN

pending

Print_ISBN

978-1-4673-1983-6

Electronic_ISBN

pending

Type

conf

DOI

10.1109/IVNC.2012.6316922

Filename

6316922