• DocumentCode
    3505661
  • Title

    Pulsed gas breakdown with high overvoltages in argon and air

  • Author

    Crull, E. ; Krompholz, H. ; Neuber, A. ; Hatfield, L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng. & Phys., Texas Tech. Univ., Lubbock, TX, USA
  • fYear
    2004
  • fDate
    1-1 July 2004
  • Firstpage
    273
  • Abstract
    Summary form only given. Fast gas breakdown with formative times in the sub-nanosecond regime is of interest for pulsed power switching and UWB applications. Use of coaxial transmission lines with conical sections connected to a test gap enables to apply fast voltage pulses to the gap, as well as the simultaneous measurement of voltage across and current through the gap. For small pulse amplitudes, with risetimes of 400 ps, a tip-plane geometry is used, with radii of curvature of 0.5 /spl mu/m. At pulse amplitudes of 5 kV, and macroscopic field enhancements on the order of 1000, delay times between current and voltage of less than 200 ps for pressures larger than 100 torr are observed, in both argon and dry air. Corresponding current risetimes I/(dI/dt) are less than 100 ps. Using a high voltage pulser (RADAN 303B with pulse slicer SN4, risetime 150 ps at 150 kV amplitude) enables the comparison of formative times for the tip-plane geometry with those of more homogeneous field distributions in the gap.
  • Keywords
    argon; electric breakdown; pulsed power switches; transmission lines; 0.5 micron; 150 kV; 150 ps; 400 ps; 5 kV; Ar; UWB applications; argon; coaxial transmission lines; current measurement; current risetimes; dry air; gas breakdown; homogeneous field distributions; pulse amplitude; pulsed gas breakdown; pulsed power switching; tip-plane geometry; voltage measurement; Argon; Coaxial components; Current measurement; Electric breakdown; Geometry; Power transmission lines; Pulse measurements; Surges; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-8334-6
  • Type

    conf

  • DOI
    10.1109/PLASMA.2004.1339921
  • Filename
    1339921