• DocumentCode
    3505999
  • Title

    Theoretical Analysis of Joint Synchronization Error Effects for OFDMA Systems

  • Author

    Chin, Wen-Long ; Chen, Sau-Gee

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
  • fYear
    2008
  • fDate
    11-14 May 2008
  • Firstpage
    1930
  • Lastpage
    1934
  • Abstract
    Few papers investigate synchronization error effects for the uplink of orthogonal frequency-division multiple access (OFDMA) systems. By contrast, this paper simultaneously analyzes the joint effects of major synchronization errors, including symbol time (ST) offset (STO), carrier frequency offset (CFO) and sampling clock frequency offset (SCFO) for the uplink of OFDMA systems in time-variant multipath fading channels. Such errors degrade the performance of an OFDMA receiver by introducing inter-carrier interference (ICI), inter-symbol interference (ISI) and multiple-access interference (MAI) into the systems. A theoretical signal-to-interference-and-noise ratio (SINR) is formulated to characterize the losses due to synchronization errors in time-variant multipath fading channels. The results provide designers a useful reference in designing suitable synchronization algorithms for the OFDMA applications.
  • Keywords
    OFDM modulation; fading channels; synchronisation; OFDMA receiver; OFDMA systems; carrier frequency offset; inter-carrier interference; inter-symbol interference; joint synchronization error; multiple-access interference; orthogonal frequency-division multiple access; sampling clock frequency offset; signal-to-interference-and-noise ratio; symbol time offset; synchronization errors; time-variant multipath fading channels; Algorithm design and analysis; Clocks; Degradation; Fading; Frequency synchronization; Intersymbol interference; Multiple access interference; OFDM; Sampling methods; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2008. VTC Spring 2008. IEEE
  • Conference_Location
    Singapore
  • ISSN
    1550-2252
  • Print_ISBN
    978-1-4244-1644-8
  • Electronic_ISBN
    1550-2252
  • Type

    conf

  • DOI
    10.1109/VETECS.2008.437
  • Filename
    4525993