• DocumentCode
    3506210
  • Title

    Effects of aluminum as dopants on the AC impedance and J-E behavior of ZnO-Bi2O3 ceramics

  • Author

    Se-Won Hen ; Kang, Hyung-Boo ; Kim, Hyung-Sik

  • Author_Institution
    Han Yang Univ., Seoul, South Korea
  • Volume
    2
  • fYear
    1997
  • fDate
    25 -30 May 1997
  • Firstpage
    863
  • Abstract
    The effects of aluminum dopants on AC impedance and J-E characteristics of ZnO-Bi2O3 binary ceramics have been investigated. The results from J-E behavior and AC impedance analysis show that the presence of aluminum in the interface can be responsible for a decrease of the Schottky barrier height and an increase in grain boundary conductivity. Also, the model based on the resulting dispersion of the grain boundary resistance gives a better account of the shape of the semicircle in heterogeneous microstructures such as the ZnO-Bi2O3-Al2O3 system
  • Keywords
    II-VI semiconductors; Schottky barriers; alumina; bismuth compounds; capacitance; ceramics; dielectric losses; electric impedance; electrical conductivity; grain boundaries; permittivity; varistors; zinc compounds; AC impedance; J-E behavior; Schottky barrier height; ZnO-Bi2O3-Al2O3; ceramics; equivalent circuits; grain boundary conductivity; grain boundary resistance dispersion; heterogeneous microstructure; varistors; Aluminum; Ceramics; Dielectric measurements; Equivalent circuits; Grain boundaries; Impedance; Microstructure; Semiconductor process modeling; Varistors; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-2651-2
  • Type

    conf

  • DOI
    10.1109/ICPADM.1997.616573
  • Filename
    616573