• DocumentCode
    3506302
  • Title

    Splat feature classification: Detection of the presence of large retinal hemorrhages

  • Author

    Tang, Li ; Niemeijer, Meindert ; Abràmoff, Michael D.

  • Author_Institution
    Ophthalmology & Visual Sci., Univ. of Iowa Hosp. & Clinics, Iowa City, IA, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    681
  • Lastpage
    684
  • Abstract
    Reliable detection of large retinal hemorrhages is important in the development of automated screening systems which can be translated into practice. In this study, we propose a novel large retinal hemorrhages detection method based on splat feature classification. Fundus photographs are partitioned into a number of splats covering the entire image. Each splat contains pixels with similar color and close spatial location. A set of distinct features is extracted within each splat. By learning properties of splats formed from blood vessels, a classifier was trained so that it can distinguish blood splats from non-blood splats. Once the blood splats, i.e. vasculature and hemorrhages, are separated from the background, the connected vasculature was removed and the remaining objects considered hemorrhage candidates. Our approach had a satisfactory performance on a test set composed of 1200 images compared to a human expert.
  • Keywords
    biomedical optical imaging; blood vessels; eye; feature extraction; image classification; medical disorders; medical image processing; photography; automated screening systems; blood vessels; classifier training; feature extraction; fundus photographs; hemorrhage blood splat; large retinal hemorrhages; retinal hemorrhage detection; splat feature classification; vasculature blood splat; Blood; Diabetes; Feature extraction; Hemorrhaging; Image color analysis; Indexes; Retina; Retinal hemorrhage; computer-aided detection or diagnosis; fundus image; splat classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872498
  • Filename
    5872498