Title :
Fast cell detection in high-throughput imagery using GPU-accelerated machine learning
Author :
Mayerich, David ; Kwon, Jaerock ; Panchal, Aaron ; Keyser, John ; Choe, Yoonsuck
Author_Institution :
Beckman Inst. for Adv. Sci. & Technol., Univ. of Illinois Urbana-Champaign, Urbana, IL, USA
fDate :
March 30 2011-April 2 2011
Abstract :
High-throughput microscopy allows fast imaging of large tissue samples, producing an unprecedented amount of sub-cellular information. The size and complexity of these data sets often out-scale current reconstruction algorithms. Overcoming this computational bottleneck requires extensive parallel processing and scalable algorithms. As high-throughput imaging techniques move into main stream research, processing must also be inexpensive and easily available. In this paper, we describe a method for cell soma detection in Knife-Edge Scanning Microscopy (KESM) using machine learning. The proposed method requires very little training data and can be mapped to consumer graphics hardware, allowing us to perform real-time cell detection at a rate that exceeds the data rate of KESM.
Keywords :
biological techniques; biological tissues; biomedical optical imaging; cellular biophysics; coprocessors; image segmentation; learning (artificial intelligence); medical image processing; neural nets; optical microscopy; parallel processing; GPU accelerated machine learning; KESM; cell soma detection; data set complexity; data set size; fast cell detection; high throughput imagery; high throughput imaging techniques; high throughput microscopy; knife edge scanning microscopy; large tissue samples; parallel processing algorithms; real time cell detection; scalable algorithms; subcellular information; Artificial neural networks; Computer architecture; Feature extraction; Graphics processing unit; Microscopy; Training; cell soma; microscopy; seed points; segmentation; three-dimensional;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-4127-3
Electronic_ISBN :
1945-7928
DOI :
10.1109/ISBI.2011.5872507