DocumentCode :
3507125
Title :
Investigation on a low pressure plasma jet in an inductively coupled plasma
Author :
Zhen-Dong Yu ; Zhi-Gang Guo ; Jie Ma ; Yi-Kang Pu
Author_Institution :
Dept. of Eng. Phys., Tsinghua Univ., Beijing, China
fYear :
2004
fDate :
1-1 July 2004
Firstpage :
306
Abstract :
Summary form only given. Tuning of electron temperature or high energy electron population enhancement can greatly influence the yield of active species and hence be quite significant for material processing. In our recent experiment of N/sub 2//Ar and N/sub 2//He discharges, a low pressure plasma jet (LPPJ) is observed out of a rectangular hole on a metallic cylinder which is used to confine an inductively coupled plasma and is placed in a large vacuum chamber. The occurrence of the LPPJ depends on the gas pressure (typically 5/spl sim/30 mTorr) and gas composition. Usually the LPPJ is about several centimeters long and has a regular profile. By using a Langmuir probe, spatially-resolved electron temperature, electron density and electron energy distribution function (EEDF) of the LPPJ are measured. An EEDF with overpopulated high energy electrons is found near the hole. A much stronger VUV radiation intensity and higher atomic nitrogen density in the LPPJ mode suggest that LPPJ can be a good source of active species and can have a profound effect in certain material processing applications.
Keywords :
Langmuir probes; argon; discharges (electric); gas mixtures; helium; nitrogen; plasma density; plasma jets; plasma pressure; plasma sources; plasma temperature; 5 to 30 mtorr; Langmuir probe; N/sub 2/-Ar; N/sub 2/-Ar discharges; N/sub 2/-He; N/sub 2/-He discharges; atomic nitrogen density; electron density; electron energy distribution function; electron temperature; gas composition; gas discharge; gas pressure; high energy electron population; inductively coupled plasma; low pressure plasma jet; material processing applications; plasma density; plasma jet; plasma pressure; plasma source; plasma temperature; vacuum chamber; Argon; Electrons; Helium; Materials processing; Plasma confinement; Plasma density; Plasma materials processing; Plasma temperature; Probes; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-8334-6
Type :
conf
DOI :
10.1109/PLASMA.2004.1339987
Filename :
1339987
Link To Document :
بازگشت