DocumentCode
3507208
Title
Finite-memory least squares universal prediction of individual continuous sequences
Author
Dar, Ronen ; Feder, Meir
Author_Institution
Dept. of EE-Syst., TAU, Tel Aviv, Israel
fYear
2011
fDate
July 31 2011-Aug. 5 2011
Firstpage
224
Lastpage
228
Abstract
In this paper we consider the problem of universal prediction of individual continuous sequences with square-error loss, using a deterministic finite-state machine (FSM). The goal is to attain universally the performance of the best constant predictor tuned to the sequence, which predicts the empirical mean and incurs the empirical variance as the loss. The paper analyzes the tradeoff between the number of states of the universal FSM and the excess loss (regret). We first present a machine, termed Exponential Decaying Memory (EDM) machine, used in the past for predicting binary sequences, and show bounds on its performance. Then we consider a new class of machines, Degenerated Tracking Memory (DTM) machines, find the optimal DTM machine and show that it outperforms the EDM machine for a small number of states. Incidentally, we prove a lower bound indicating that even with large number of states the regret of the DTM machine does not vanish. Finally, we show a lower bound on the achievable regret of any FSM, and suggest a new machine, the Enhanced Exponential Decaying Memory, which attains the bound and outperforms the EDM for any number of states.
Keywords
binary sequences; finite state machines; least squares approximations; DTM machines; EDM machine; FSM; binary sequences; degenerated tracking memory machines; exponential decaying memory machine; finite state machine; finite-memory least squares universal prediction; individual continuous sequences; square-error loss; Data compression; Educational institutions; Encoding; Quantization; Resource management; Silicon; Universal prediction; finite-memory; individual continuous sequences; least-squares;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location
St. Petersburg
ISSN
2157-8095
Print_ISBN
978-1-4577-0596-0
Electronic_ISBN
2157-8095
Type
conf
DOI
10.1109/ISIT.2011.6033961
Filename
6033961
Link To Document