• DocumentCode
    3507367
  • Title

    Environmental reliability of nano-structured polymer-metal composite thermal interface material

  • Author

    Xiuzhen Lu ; Mengke Zhuang ; Lei Zhang ; Lilei Ye ; Liu, Jiangchuan

  • Author_Institution
    Key State Lab. for New Displays & Syst. Applic., Shanghai Univ., Shanghai, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    1326
  • Lastpage
    1328
  • Abstract
    Heat dissipation has become a `bottleneck´ for the properties of electronics products and photoelectronic devices. Thermal interface material (TIM) plays a key role in heat dissipation, and must have flexibility and high thermal conductivity in order to decrease the thermal resistance of the interface between the device and heat sink or cooler. We developed a new type of nano-TIM based electrospun technology. Metal with low melting point was injected into the polymer nanofiber scaffold fabricated by electrospun. The heat of the electronic devices dispersed through the metal, resulting in high thermal conductivity of the nano-TIM. Environmental reliability of nano-structured polymer-metal composite thermal interface material was studied by thermal cycling test. A sandwich structure was used to get shear strength of pull test. The shear strength of the samples dropped to about 50% after 500 cycles. SEM and EDS results indicate that overflow of alloy during thermal cycling test leads to decreasing shear strength.
  • Keywords
    X-ray chemical analysis; composite material interfaces; cooling; environmental factors; heat sinks; melting point; nanofibres; scanning electron microscopy; semiconductor device reliability; shear strength; thermal conductivity; thermal management (packaging); thermal resistance; EDS; SEM; cooler; electronics products; environmental reliability; heat dissipation; heat sink; melting point; nano-TIM based electrospun technology; nanostructured polymer-metal composite thermal interface material; photoelectronic devices; polymer nanofiber scaffold; pull test; sandwich structure; shear strength; thermal conductivity; thermal cycling test; thermal resistance; Abstracts; Metals; Nanoscale devices; Resistance heating; Roads; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474850
  • Filename
    6474850