• DocumentCode
    3507390
  • Title

    Continuous-domain ARMA modeling for ultrasound tissue characterization

  • Author

    Maggio, S. ; Alessandrini, M. ; Speciale, N. ; Bernard, O. ; Vray, D. ; Basset, O. ; Unser, M.

  • Author_Institution
    Dept. of Electron., Comput. Sci. & Syst., Univ. di Bologna, Bologna, Italy
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    895
  • Lastpage
    898
  • Abstract
    In this study, we investigate the possibility of applying a continuous-time ARMA (CARMA) model to radio-frequency ultrasound signals. We consider the effect of the discretization process on the parameters of the continuous system, and we take into account the exponential nature of the autocorrelation function of the model to derive continuous-domain information from the parameters of the discrete ARMA process. We validate the effectiveness of the CARMA model parameters for the characterization of ultrasound tissues on a sequence of phantom images that represent various concentrations of scatterers. We also compare the proposed CARMA coefficients and the traditional ARMA parameters on the basis of their performance in discriminating between phantom tissues. We show that working in the continuous domain brings additional useful information to characterize the imaged materials.
  • Keywords
    autoregressive moving average processes; biological tissues; biomedical ultrasonics; medical image processing; phantoms; CARMA model; continuous domain ARMA modeling; continuous system parameters; continuous time ARMA model; discretization effects; exponential autocorrelation function; phantom images; phantom tissues; radiofrequency ultrasound signals; scatterer concentrations; ultrasound tissue characterization; Computational modeling; Estimation; Numerical models; Poles and zeros; Radio frequency; Spline; Ultrasonic imaging; ARMA; CARMA; exponential spline; tissue characterization; ultrasound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872548
  • Filename
    5872548