• DocumentCode
    3507438
  • Title

    Restoring artifact-free microscopy image sequences

  • Author

    Yin, Zhaozheng ; Kanade, Takeo

  • Author_Institution
    Robot. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    909
  • Lastpage
    913
  • Abstract
    Phase contrast and differential interference contrast, which are used to capture microscopy images of living cells, contain a few artifacts such as halo and shadow-cast effect. Removing these artifacts from microscopy images facilitates automated microscopy image analysis, such as the cell segmentation that is a critical step in cell tracking systems. We propose a restoration algorithm based on the microscopy imaging model and consider temporal consistency when restoring time-lapse microscopy image sequences. The artifact-free microscopy images are restored by minimizing a regularized quadratic cost function that is adaptable to input image properties. Our method achieves high segmentation accuracy and low computational cost compared to the previous methods.
  • Keywords
    biological techniques; biology computing; cellular biophysics; image restoration; image segmentation; image sequences; minimisation; optical microscopy; artifact free image restoration; artifact free microscopy images; automated microscopy image analysis; cell segmentation; cell tracking systems; differential interference contrast microscopy; halo artifacts; living cells; microscopy image sequence restoration; microscopy imaging model; phase contrast microscopy; regularized quadratic cost function minimisation; restoration algorithm; shadow cast artifacts; temporal consistency; time lapse microscopy image sequences; Image restoration; Image segmentation; Microscopy; Optical microscopy; Pixel; Table lookup; Microscopy image analysis; differential interference contrast; image restoration; phase contrast;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872551
  • Filename
    5872551