DocumentCode
3507656
Title
Low voltage NexFET with record low figure of merit
Author
Wang, Jun ; Korec, Jacek ; Xu, Shuming
Author_Institution
Texas Instrum. Inc., Power Stage BU, Bethlehem, PA, USA
fYear
2012
fDate
5-9 Feb. 2012
Firstpage
149
Lastpage
151
Abstract
A novel planar gate double-diffused MOS (DMOS) transistor is proposed for low voltage (<;10V) DC/DC converter and load switch applications. The novel MOSFET includes a heavily doped sinker layer in the JFET region and a field plate structure on the surface of the LDD region. The LDD region is fully depleted at a small drain bias, and the field plate acts as a shield electrode significantly reducing the gate to drain capacitance. The proposed MOSFET with a rating breakdown voltage of 12 V and a maximum gate voltage of 8 V demonstrates a specific on-resistance of 5.8 mΩ·mm2 and a gate to drain charge of 0.4 nC/mm2 at a gate voltage of 4.5 V. The corresponding figure of merit (FOM= RON, sp·Qgd, sp) of the power MOSFET is 2.3 mΩ·nC, which is record low in the published literature.
Keywords
DC-DC power convertors; electric resistance; low-power electronics; power MOSFET; semiconductor device breakdown; DMOS transistor; JFET region; LDD region; breakdown voltage; doped sinker layer; field plate structure; figure of merit; load switch application; low voltage DC/DC converter; low voltage NexFET; on-resistance; planar gate double-diffused MOS transistor; power MOSFET; shield electrode; voltage 12 V; voltage 4.5 V; voltage 8 V; DC-DC power converters; Logic gates; Low voltage; Power MOSFET; Temperature measurement; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location
Orlando, FL
Print_ISBN
978-1-4577-1215-9
Electronic_ISBN
978-1-4577-1214-2
Type
conf
DOI
10.1109/APEC.2012.6165811
Filename
6165811
Link To Document