• DocumentCode
    3507706
  • Title

    Effects of cooling rate and solder volume on the formation of large Ag3Sn plates in Sn-Ag based solder joints

  • Author

    Qiang Zhou ; Mingliang Huang ; Ning Zhao ; Zhijie Zhang

  • Author_Institution
    Electron. Packaging Mater. Lab., Dalian Univ. of Technol., Dalian, China
  • fYear
    2012
  • fDate
    13-16 Aug. 2012
  • Firstpage
    1403
  • Lastpage
    1406
  • Abstract
    The relationships between the morphology of Ag3Sn phases and the cooling rate, solder volume and 0.7 wt.% Cu addition into Sn-3.5Ag solder were investigated in this study. The morphology of Ag3Sn phases in the solder joints was greatly affected by the cooling rate. In Sn-3.5Ag/ENEPIG (electroless nickel electroless podium immersion gold) solder joints, large plate-like Ag3Sn phases formed on the interfacial intermetallic compounds (IMCs) under furnace cooling, normal cooling and air cooling conditions, while no plate-like Ag3Sn phases formed under water cooling condition. The volume of solder ball also had a significant effect on the morphology of Ag3Sn phases in the solder joints. Large plate-like Ag3Sn phases formed at the Sn-3.5Ag (50 μm)/ENEPIG (40 μm) and Sn-3.5Ag (100 μm)/ENEPIG (150 μm) interfaces under furnace cooling condition. However, no plate-like Ag3Sn phases were detected at the Sn-3.5Ag (200 μm)/ENEPIG (150 μm) interface under the same cooling condition. The degree of undercooling increased with downsizing solder joints, which would extend the growth time of Ag3Sn phases in the solidification process. The addition of 0.7 wt.% Cu into Sn-3.5Ag solder had little effect on the morphology of Ag3Sn phases in the solder joints.
  • Keywords
    copper alloys; electronics packaging; furnaces; nickel alloys; plates (structures); silver alloys; solders; solidification; tin alloys; undercooling; ENEPIG solder joints; SnAg-NiAu; air cooling conditions; cooling rate; electroless nickel electroless podium immersion gold solder joints; furnace cooling condition; interfacial intermetallic compounds; lMC; large plates formation; size 100 mum; size 150 mum; size 200 mum; size 40 mum; size 50 mum; solder ball volume; solder joint downsizing; solidification process; water cooling condition; Abstracts; Cooling; Furnaces; Joints; Shearing; Soldering; Thermal factors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4673-1682-8
  • Electronic_ISBN
    978-1-4673-1680-4
  • Type

    conf

  • DOI
    10.1109/ICEPT-HDP.2012.6474868
  • Filename
    6474868