DocumentCode
3507706
Title
Effects of cooling rate and solder volume on the formation of large Ag3 Sn plates in Sn-Ag based solder joints
Author
Qiang Zhou ; Mingliang Huang ; Ning Zhao ; Zhijie Zhang
Author_Institution
Electron. Packaging Mater. Lab., Dalian Univ. of Technol., Dalian, China
fYear
2012
fDate
13-16 Aug. 2012
Firstpage
1403
Lastpage
1406
Abstract
The relationships between the morphology of Ag3Sn phases and the cooling rate, solder volume and 0.7 wt.% Cu addition into Sn-3.5Ag solder were investigated in this study. The morphology of Ag3Sn phases in the solder joints was greatly affected by the cooling rate. In Sn-3.5Ag/ENEPIG (electroless nickel electroless podium immersion gold) solder joints, large plate-like Ag3Sn phases formed on the interfacial intermetallic compounds (IMCs) under furnace cooling, normal cooling and air cooling conditions, while no plate-like Ag3Sn phases formed under water cooling condition. The volume of solder ball also had a significant effect on the morphology of Ag3Sn phases in the solder joints. Large plate-like Ag3Sn phases formed at the Sn-3.5Ag (50 μm)/ENEPIG (40 μm) and Sn-3.5Ag (100 μm)/ENEPIG (150 μm) interfaces under furnace cooling condition. However, no plate-like Ag3Sn phases were detected at the Sn-3.5Ag (200 μm)/ENEPIG (150 μm) interface under the same cooling condition. The degree of undercooling increased with downsizing solder joints, which would extend the growth time of Ag3Sn phases in the solidification process. The addition of 0.7 wt.% Cu into Sn-3.5Ag solder had little effect on the morphology of Ag3Sn phases in the solder joints.
Keywords
copper alloys; electronics packaging; furnaces; nickel alloys; plates (structures); silver alloys; solders; solidification; tin alloys; undercooling; ENEPIG solder joints; SnAg-NiAu; air cooling conditions; cooling rate; electroless nickel electroless podium immersion gold solder joints; furnace cooling condition; interfacial intermetallic compounds; lMC; large plates formation; size 100 mum; size 150 mum; size 200 mum; size 40 mum; size 50 mum; solder ball volume; solder joint downsizing; solidification process; water cooling condition; Abstracts; Cooling; Furnaces; Joints; Shearing; Soldering; Thermal factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4673-1682-8
Electronic_ISBN
978-1-4673-1680-4
Type
conf
DOI
10.1109/ICEPT-HDP.2012.6474868
Filename
6474868
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