• DocumentCode
    3507863
  • Title

    The role of bipolar structures in a power MOS process

  • Author

    Marshall, Andrew ; Teggatz, Ross

  • Author_Institution
    Texas Instrum. Inc., USA
  • fYear
    1996
  • fDate
    29 Sep-1 Oct 1996
  • Firstpage
    208
  • Lastpage
    211
  • Abstract
    Modern power IC processes usually optimize DMOS outputs, with little emphasis on bipolar structures, for wafer cost reasons. We describe the role of bipolar structures in a high efficiency power IC process, and design techniques to allow use of non-optimized bipolar devices
  • Keywords
    MOS integrated circuits; current limiters; electrostatic discharge; integrated circuit design; power integrated circuits; protection; DMOS outputs; ESD structures; bipolar structures; current limiting circuits; design techniques; nonoptimized bipolar devices; power MOS process; Automotive engineering; Circuit simulation; Current supplies; MOS devices; Photonic band gap; Resistors; Switches; Temperature sensors; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 1996., Proceedings of the 1996
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1088-9299
  • Print_ISBN
    0-7803-3516-3
  • Type

    conf

  • DOI
    10.1109/BIPOL.1996.554649
  • Filename
    554649