Reliability assessment for LED luminaires based on Step-Stress Accelerated Life Test

Author

Ming Gong ; Xiaosong Ma ; Daoguo Yang ; Miao Cai ; Zhen Zhang ; Rongbin Ren ; Yu Yang

Author_Institution

Guangxi Key Lab. of Manuf. Syst. & Adv. Manuf. Technol., Guilin Univ. of Electron. Technol., Guilin, China

fYear

2012

fDate

13-16 Aug. 2012

Firstpage

1546

Lastpage

1549

Abstract

LED luminaires have the characteristics of high reliability and long life-time and it is difficult to be evaluation of reliability. In order to assess the reliability of LED luminaires, Step Stress Accelerated Life Test (SSALT) method with temperature as its stress is used to test the LED luminaires. This method has shortened the test-time greatly. The test-time at 45°C is converted to a test-time at 85°C by using Nelson´s law. Besides, Arrhenius model is selected to indicate the relationship between the average life of LED luminaires and temperature. Then, Maximum Likelihood Estimation (MLE) of LED luminaires life is established under lognormal distribution. Matlab software is applied to calculate the life of the samples and the reliability curve is acquired based on relevant reliability parameters.

Keywords

life testing; light emitting diodes; log normal distribution; maximum likelihood estimation; reliability; stress analysis; Arrhenius model; LED luminaires; MLE; Matlab software; Nelson law; SSALT method; lognormal distribution; maximum likelihood estimation; reliability assessment; reliability curve; reliability parameters; step-stress accelerated life test method; temperature 45 degC; temperature 85 degC; Light emitting diodes; Photonics; Reactive power; Reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on

Conference_Location

Guilin

Print_ISBN

978-1-4673-1682-8

Electronic_ISBN

978-1-4673-1680-4

Type

conf

DOI

10.1109/ICEPT-HDP.2012.6474901

Filename

6474901