• DocumentCode
    3508622
  • Title

    Influence of parasitic effects on passive cancellation of common mode noise in a boost converter

  • Author

    Schmidt, Martin ; Stahl, Jürgen ; Albach, Manfred

  • Author_Institution
    Dept. of Electromagn. Fields, Friedrich-Alexander-Univ. Erlangen-Nuremberg, Erlangen, Germany
  • fYear
    2012
  • fDate
    5-9 Feb. 2012
  • Firstpage
    471
  • Lastpage
    477
  • Abstract
    Passive cancellation of common mode (cm) noise is a very promising alternative to a conventional cm filter. The basic idea has already been described in literature. However, to the authors´ knowledge, a thorough investigation of parasitic effects has not been published yet. It turns out that the parasitic effects are crucial for this passive cancellation method. Therefore it is of great interest to investigate this influence. In combination with a finite differential mode (dm) filter capacitor Cdm a second capacitor Cgnd is required to reach theoretically an infinite attenuation due to a perfect compensation. However, in practice this is prevented by the transformer´s leakage inductance. An analysis based on frequency-response plots and phasor diagrams allows quantifying the influences. Minimizing the leakage inductance by an optimized transformer design results in the best attenuation of cm noise. Finally, the theoretical results are verified in a test set-up.
  • Keywords
    capacitors; circuit noise; interference filters; interference suppression; magnetic leakage; power convertors; transformers; boost converter; common mode noise passive cancellation; finite differential mode filter capacitor; frequency response; infinite attenuation; optimized transformer design; parasitic effects; phasor diagram; transformer leakage inductance; Capacitors; Frequency domain analysis; Inductance; Noise; Passive filters; Resonant frequency; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1215-9
  • Electronic_ISBN
    978-1-4577-1214-2
  • Type

    conf

  • DOI
    10.1109/APEC.2012.6165862
  • Filename
    6165862