DocumentCode :
3508631
Title :
Highly reliable nickel-tin transient liquid phase bonding technology for high temperature operational power electronics in electrified vehicles
Author :
Yoon, Sang Won ; Shiozaki, Koji ; Yasuda, Satoshi ; Glover, Michael D.
Author_Institution :
Electron. Res. Dept., Toyota Res. Inst. of North, Ann Arbor, MI, USA
fYear :
2012
fDate :
5-9 Feb. 2012
Firstpage :
478
Lastpage :
482
Abstract :
This paper presents an approach to nickel-tin transient liquid phase (TLP) bonding that provides high reliability for high temperature operational power electronics in electrified vehicles. The need for automotive power electronics to operate at high temperature presents significant challenges in terms of the packaging and bonding technology used. Transient liquid phase (TLP) bonding is one attachment approach that addresses these challenges. The Ni/Sn TLP bonding process exhibits a number of desirable characteristics, including a good CTE match with silicon and silicon carbide, popularity in conventional power electronics, low cost, and uniform alloy formation. The work herein presents a Ni/Sn TLP bonding technology (ready for high temperature operation up to 200°C) as applied to large size silicon power devices (12 mm × 9 mm). Analysis indicates that the resulting bondline is uniformly composed of Ni3Sn4 alloy throughout. This bonding approach has exhibited excellent reliability for bonded devices after 1000 thermal cycles from -40 to 200°C.
Keywords :
automotive electronics; bonding processes; electric vehicles; electronics packaging; nickel alloys; power electronics; reliability; silicon alloys; tin alloys; CTE match; Ni-Sn; Ni3Sn4; SiC; automotive power electronics; electrified vehicles; high temperature operational power electronics; packaging technology; temperature -40 degC to 200 degC; transient liquid phase bonding technology; uniform alloy formation; Bonding; Nickel; Power electronics; Reliability; Silicon; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1215-9
Electronic_ISBN :
978-1-4577-1214-2
Type :
conf
DOI :
10.1109/APEC.2012.6165863
Filename :
6165863
Link To Document :
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