• DocumentCode
    3508819
  • Title

    A high boost ratio bidirectional isolated DC-DC converter for wide range low voltage high current applications

  • Author

    Li, Cong ; Herrera, Luis ; Jia, Jizhou ; Fu, Lixing ; Huang, Yi ; Wang, Jin ; Isurin, Alexander ; Cook, Alexander

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2012
  • fDate
    5-9 Feb. 2012
  • Firstpage
    539
  • Lastpage
    546
  • Abstract
    This paper introduces a high boost ratio, bidirectional, isolated, dc/dc converter designed as an interface between low voltage, high current dc sources and 24 V dc systems. This converter realizes bidirectional power flow with two main switches and operates under a wide input voltage range, from 1.5 V to 12 V, with an input current as high as 300 A. An active snubber circuit is utilized to recycle the energy stored in the leakage inductor of transformer and realize zero voltage switching (ZVS) off for one main switch. The zero current switching (ZCS) on of this switch is achieved by using transformer leakage inductor, thus no additional components are needed. Furthermore, the power loss of another main switch is minimized by operating it in the Synchronous Rectification mode. Complete circuit description and operation principles are provided in this paper. A 1.2 kW lab prototype has been built and tested with full power rating. Both simulation results and experimental results are presented to verify proposed functions.
  • Keywords
    DC-DC power convertors; snubbers; active snubber circuit; bidirectional power flow; circuit description; high boost ratio bidirectional isolated DC-DC converter; low voltage high current application; power rating; synchronous rectification mode; transformer leakage inductor; zero current switching; zero voltage switching; Inductance; Logic gates; Low voltage; Rails; Snubbers; Switches; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4577-1215-9
  • Electronic_ISBN
    978-1-4577-1214-2
  • Type

    conf

  • DOI
    10.1109/APEC.2012.6165872
  • Filename
    6165872