DocumentCode
3508831
Title
Semi-Synthetic Circuit Generation Using Graph Monomorphism for Testing Incremental Placement and Incremental Routing Tools
Author
Grant, David ; Chin, Scott ; Lemieux, Guy
Author_Institution
British Columbia Univ., Vancouver, BC
fYear
2006
fDate
28-30 Aug. 2006
Firstpage
1
Lastpage
4
Abstract
FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new method to generate benchmark circuits by removing part of a real circuit and replacing it with a synthetic clone. This replacement or stitching process can easily introduce combinational loops if the synthetic circuit contains an input-to-output dependence that was not in the original subcircuit it is replacing. We show that this can be expressed as the graph monomorphism problem, and that a solution to that problem gives a precise stitching assignment that is cycle-free. This technique can be used to create new benchmark circuits that are identical to the original circuit except for small, local changes. The resulting semi-synthetic benchmarks are ideal for testing incremental place and route tools.
Keywords
combinational circuits; graph theory; logic CAD; network routing; benchmark circuits; combinational loops; graph monomorphism; incremental placement; incremental routing tools; replacement process; semisynthetic circuit generation; stitching process; synthetic circuit; Benchmark testing; Character generation; Circuit testing; Cloning; Field programmable gate arrays; Logic; Routing; Stochastic processes; Stress; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Field Programmable Logic and Applications, 2006. FPL '06. International Conference on
Conference_Location
Madrid
Print_ISBN
1-4244-0312-X
Type
conf
DOI
10.1109/FPL.2006.311300
Filename
4101062
Link To Document