• DocumentCode
    3508831
  • Title

    Semi-Synthetic Circuit Generation Using Graph Monomorphism for Testing Incremental Placement and Incremental Routing Tools

  • Author

    Grant, David ; Chin, Scott ; Lemieux, Guy

  • Author_Institution
    British Columbia Univ., Vancouver, BC
  • fYear
    2006
  • fDate
    28-30 Aug. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    FPGA architects are always searching for more benchmark circuits to stress CAD tools and device architectures. In this paper we present a new method to generate benchmark circuits by removing part of a real circuit and replacing it with a synthetic clone. This replacement or stitching process can easily introduce combinational loops if the synthetic circuit contains an input-to-output dependence that was not in the original subcircuit it is replacing. We show that this can be expressed as the graph monomorphism problem, and that a solution to that problem gives a precise stitching assignment that is cycle-free. This technique can be used to create new benchmark circuits that are identical to the original circuit except for small, local changes. The resulting semi-synthetic benchmarks are ideal for testing incremental place and route tools.
  • Keywords
    combinational circuits; graph theory; logic CAD; network routing; benchmark circuits; combinational loops; graph monomorphism; incremental placement; incremental routing tools; replacement process; semisynthetic circuit generation; stitching process; synthetic circuit; Benchmark testing; Character generation; Circuit testing; Cloning; Field programmable gate arrays; Logic; Routing; Stochastic processes; Stress; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications, 2006. FPL '06. International Conference on
  • Conference_Location
    Madrid
  • Print_ISBN
    1-4244-0312-X
  • Type

    conf

  • DOI
    10.1109/FPL.2006.311300
  • Filename
    4101062