• DocumentCode
    3509068
  • Title

    Wood defects classification using Artificial Metaplasticity neural network

  • Author

    Marcano-Cedeno, Alexis ; Quintanilla-Domínguez, J. ; Andina, D.

  • Author_Institution
    Group for Autom. in Signals & Commun., Tech. Univ. of Madrid, Madrid, Spain
  • fYear
    2009
  • fDate
    3-5 Nov. 2009
  • Firstpage
    3422
  • Lastpage
    3427
  • Abstract
    Artificial Metaplasticity (AMP) is a novel Artificial Neural Network (ANN) training algorithm inspired in biological metaplasticity property of neurons and Shannon´s information theory. During training phase, the AMP training algorithm gives more relevance to the less frequent patterns and subtracts relevance to the frequent ones, achieving a much more efficient training, while at least maintaining the MLP´s performance. AMP is specially recommended when few patterns are available to train the network. In this paper, we implement an Artificial Metaplasticity MLP (AMMLP) in order to classify defects in wood images. The defects are three different types of knots found in wood surfaces. Classification is based on the features obtained from Gabor filters. Experimental results show that AMMLPs reach better accuracy than the classical BP algorithm as well as with recently proposed algorithms applied on the same database.
  • Keywords
    Gabor filters; feature extraction; image classification; information theory; learning (artificial intelligence); multilayer perceptrons; wood; Gabor filters; MLP; Shannon information theory; artificial metaplasticity neural network; biological metaplasticity property; multilayer perceptron; neural network training algorithm; neurons; wood defects classification; wood images; Aerospace industry; Artificial neural networks; Backpropagation algorithms; Band pass filters; Communication industry; Feature extraction; Frequency; Gabor filters; Manufacturing industries; Spatial databases;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2009. IECON '09. 35th Annual Conference of IEEE
  • Conference_Location
    Porto
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-4648-3
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2009.5415189
  • Filename
    5415189