• DocumentCode
    3509455
  • Title

    Automated cropping and artifact removal for knife-edge scanning microscopy

  • Author

    Kwon, Jaerock ; Mayerich, David ; Choe, Yoonsuck

  • Author_Institution
    Electr. & Comput. Eng., Kettering Univ., Flint, MI, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1366
  • Lastpage
    1369
  • Abstract
    Knife Edge Scanning Microscopy (KESM) is a high-throughput imaging technique used to obtain large-scale anatomical information (≈1cm3) at sub-micrometer resolution. Data acquisition has been fully automated, however significant post-processing and reconstruction must be done manually. KESM is unique in that illumination and tissue sectioning are performed using a diamond knife. Therefore many of the physical forces applied to the knife (e.g., vibration, slip, and light refraction) manifest as image artifacts and must be removed in post-processing. In this paper, we propose a fully automated framework to extract valid data from imaged sections and remove lighting artifacts, allowing reconstruction of the volumetric structures in multiple terabyte-scale data sets.
  • Keywords
    biological techniques; biological tissues; biology computing; data acquisition; feature extraction; image reconstruction; image resolution; optical microscopy; artifact removal; automated cropping; data acquisition; feature extraction; high-throughput imaging technique; image postprocessing; image reconstruction; knife-edge scanning microscopy; large-scale anatomical information; light refraction; submicrometer resolution; submicrometer resolution imaging; terabyte-scale data sets; tissue sectioning; Image edge detection; Lighting; Mice; Microscopy; Noise; Pixel; KESM; Knife-edge Scanning Microscopy; cropping; noise removal; serial sectioning microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872654
  • Filename
    5872654