The research on fault equivalent analysis method in testability experiment validation

With the existing fault injection techniques, many faults that can fully expose testability design defects can not be injected. To solve this problem, a method of fault equivalent analysis is proposed. By this means, some characteristics are extracted from the faults those unable to be injected, and ldquoyield analysisrdquo or ldquoyielded analysisrdquo is performed. Then the minimal cut sets of atom faults is obtained and selected, which are finally equivalent to the atom faults sequence. Applications show that the method not only solves the problem that many faults are not able to be injected, but also ensures the effect of testability experiment validation.