DocumentCode
3510124
Title
Knowledge transfer and the limits to profitability: an empirical study of problem-solving practices in the semiconductor industry
Author
Weber, Charles ; Von Hippel, Eric
Author_Institution
Sloan Sch. of Manage., MIT, Cambridge, MA, USA
Volume
Supplement
fYear
2001
fDate
2001
Firstpage
349
Abstract
A broadly based empirical study of problem-solving practices in the semiconductor industry reveals that the inability to transfer knowledge rapidly is limiting the profitability of semiconductor manufacturers. Extremely high user loss rates force users and suppliers of semiconductor process and diagnostic technology to solve problems as rapidly as possible. Unfortunately, both sides possess knowledge that is required to solve problems but cannot be transferred rapidly enough for extensive losses to be avoided. Collaboration between users and suppliers, in which problem solvers physically relocate from one side´s site to the other´s, is minimizing losses but creating a shortage of experts that threatens the health of the industry. A series of practices that will reduce the cost of knowledge transfer is presented. Foremost among these is the establishment of an Internet-enabled toolkit for remote diagnostics and repair
Keywords
commerce; costing; electronics industry; problem solving; product development; research and development management; technology transfer; Internet-enabled toolkit; R&D management; collaboration; problem-solving practices; profitability limits; remote diagnostics; remote repair; semiconductor diagnostic technology; semiconductor industry; semiconductor manufacturers; semiconductor process technology; technological knowledge transfer; user loss rates; Costs; Electronics industry; Investments; Knowledge management; Knowledge transfer; Manufacturing processes; Problem-solving; Productivity; Profitability; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
Management of Engineering and Technology, 2001. PICMET '01. Portland International Conference on
Conference_Location
Portland, OR
Print_ISBN
1-890843-06-7
Type
conf
DOI
10.1109/PICMET.2001.952034
Filename
952034
Link To Document