• DocumentCode
    3510449
  • Title

    Efficient single-shot Z-shim EPI via spatial and temporal encoding

  • Author

    Hoge, W. Scott ; Pan, Hong ; Tan, Huan ; Stern, Emily ; Kraft, Robert A.

  • Author_Institution
    Dept. of Radiol., Brigham & Women´´s Hosp., Boston, MA, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1565
  • Lastpage
    1568
  • Abstract
    Echo planar imaging (EPI) is used widely for neurological fMRI studies. However, in regions of magnetic field inhomogeneity - particularly near the nasal sinuses - EPI suffers from signal dropout. Z-shim methods are one approach to recover this lost signal, where a z gradient is employed prior to the EPI readout echo train to counter phase accumulation in the signal dropout region. Typically, two separate images of the same region are acquired under different z-shim gradient strengths, and then combined into a composite image. Single-shot z-shim methods give improved temporal resolution, but with a cost of longer echo trains, which increases geometric distortion. Here, we combine parallel MR imaging (pMRI) with a single-shot z-shim method to achieve short echo train lengths. We also employ temporal encoding to counter Nyquist ghost effects, which improves the pMRI calibration. We demonstrate the method with phantom images, and evaluate its suitability for fMRI applications.
  • Keywords
    biomedical MRI; image coding; image resolution; medical image processing; neurophysiology; phantoms; Nyquist ghost effects; echo planar imaging; efficient single-shot Z-shim EPI; geometric distortion; magnetic field inhomogeneity; nasal sinuses; neurological fMRI; phantom; short echo train lengths; spatial encoding; temporal encoding; temporal resolution; Acceleration; Calibration; Coils; Encoding; Image reconstruction; Magnetic resonance imaging; Parallel imaging; single-shot EPI; susceptibility artifact correction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872700
  • Filename
    5872700