Title :
A crystal spectrograph and its application in plasma focus
Author :
Zhang, G.X. ; Liu, M.H. ; Lee, Sang-Rim ; Lee, P.
Author_Institution :
Tsinghua Univ., Beijing, China
Abstract :
Summary form only given. A compact crystal spectrograph for soft X-ray measurement in a plasma focus facility was designed and studied. The spectrograph has an adjustment system with 5 degrees of freedom making it easy to align and use. The spectrography provided spatial resolved spectrum in one dimension over 0.1-5 nm wavelength range. A TIAP crystal with different form (flat and curve) was used to obtain spatial resolve spectra of Ne and Ar ion from DPF plasma focus. Such a spectrograph is also suitable to be used coupled to soft streak camera or X-ray CCD detector.
Keywords :
CCD image sensors; X-ray detection; argon; neon; plasma diagnostics; plasma focus; streak cameras; 0.1 to 5 nm; Ar; DPF plasma focus; Ne; TIAP crystal; X-ray CCD detector; compact crystal spectrograph; degrees of freedom; soft X-ray measurement; soft streak camera; spatial resolved spectrum; Argon; Charge coupled devices; Charge-coupled image sensors; Plasma applications; Plasma measurements; Plasma waves; Plasma x-ray sources; Spatial resolution; Wavelength measurement; X-ray detection;
Conference_Titel :
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-8334-6
DOI :
10.1109/PLASMA.2004.1340162
