Title :
Limitations due to systematic phase errors on the extraction of loss tangent from micron-sized transmission line test structures
Author :
Friar, R.J. ; Neikirk, D.P.
Author_Institution :
Texas Univ., Austin, TX, USA
Abstract :
When two-port S-parameters are used to characterize microstrip test structures, finite phase measurement precision and small reference plane offsets can significantly limit the ability to extract the loss tangent from transmission lines with finite series resistance
Keywords :
S-parameters; dielectric losses; dielectric thin films; electric resistance; error analysis; high-frequency transmission lines; integrated circuit interconnections; integrated circuit measurement; integrated circuit metallisation; integrated circuit packaging; measurement errors; microstrip lines; phase measurement; finite phase measurement precision; finite series resistance; loss tangent; loss tangent extraction; microstrip test structures; reference plane offsets; systematic phase errors; transmission line test structures; transmission lines; two-port S-parameters; Conducting materials; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency; Geometry; Microstrip; Phase measurement; Scattering parameters; Testing;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1999
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5597-0
DOI :
10.1109/EPEP.1999.819195
