DocumentCode :
3510662
Title :
Investigation of durability analysis method based on performance degradation analysis
Author :
Yang, Moucun ; Zhang, Ling ; Hong, Nie ; Xu, Haihan
Author_Institution :
Sch. of Mech. & Power Eng. Nanjing, Nanjing Univ. of Technol., Nanjing, China
fYear :
2009
fDate :
20-24 July 2009
Firstpage :
1066
Lastpage :
1070
Abstract :
One of the main concerns of mechanical structures is structural damage due to fatigue. This phenomenon is accentuated in initial flaw of structure, areas of stress concentration, and the connection of components, etc. Initial fatigue quality and configuration of structure have the most important effect on durability. However, obtaining equivalent initial flaw size (EIFS) of structure with durability tests is very costly and time-consuming. A new method of determining initial fatigue quality and crack growth rate is presented with performance degradation curves of specimens in this paper. Specimens with one rivet hole are used in the tests. According to test results and theoretic derivation, the relationship of crack length with loading cycle is established. Then, EIFS values are calculated and fatigue crack growth rates are estimated using exponential fitness technique. The applicability and validity of the method are verified with theoretic computation of fracture limit finally.
Keywords :
crack detection; durability; fatigue cracks; life testing; structural engineering; durability analysis method; durability tests; exponential fitness technique; fatigue crack growth rate; mechanical structures; performance degradation analysis; stress concentration; structural damage; Degradation; Educational institutions; Fatigue; Geometry; Length measurement; Performance analysis; Power engineering; Resonant frequency; Stress; Testing; crack growth rate; durability analysis; equivalent initial flaw size (EIFS); fracture limit; performance degradation analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
Type :
conf
DOI :
10.1109/ICRMS.2009.5269998
Filename :
5269998
Link To Document :
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