DocumentCode :
3510672
Title :
Generating probability distributions using multivalued stochastic relay circuits
Author :
Lee, David ; Bruck, Jehoshua
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Palo Alto, CA, USA
fYear :
2011
fDate :
July 31 2011-Aug. 5 2011
Firstpage :
308
Lastpage :
312
Abstract :
The problem of random number generation dates back to von Neumann´s work in 1951. Since then, many algorithms have been developed for generating unbiased bits from complex correlated sources as well as for generating arbitrary distributions from unbiased bits. An equally interesting, but less studied aspect is the structural component of random number generation as opposed to the algorithmic aspect. That is, given a network structure imposed by nature or physical devices, how can we build networks that generate arbitrary probability distributions in an optimal way? In this paper, we study the generation of arbitrary probability distributions in multivalued relay circuits, a generalization in which relays can take on any of N states and the logical `and´ and `or´ are replaced with `min´ and `max´ respectively. Previous work was done on two-state relays. We generalize these results, describing a duality property and networks that generate arbitrary rational probability distributions. We prove that these networks are robust to errors and design a universal probability generator which takes input bits and outputs arbitrary binary probability distributions.
Keywords :
multivalued logic; random number generation; relays; statistical distributions; stochastic processes; arbitrary binary probability distribution; arbitrary rational probability distribution; complex correlated source; duality property; multivalued stochastic relay circuit; network structure; random number generation; two-state relay; universal probability generator; Neurons; Probability distribution; Random number generation; Relays; Stochastic processes; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Theory Proceedings (ISIT), 2011 IEEE International Symposium on
Conference_Location :
St. Petersburg
ISSN :
2157-8095
Print_ISBN :
978-1-4577-0596-0
Electronic_ISBN :
2157-8095
Type :
conf
DOI :
10.1109/ISIT.2011.6034134
Filename :
6034134
Link To Document :
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