Title :
Investigation in lifetime evaluation of electron multiplier based on step stress accelerated degradation test in a two-way design
Author :
Mo, Yongqiang ; Hu, Yongpan ; Wang, Yashun ; Zhang, Chunhua ; Chen, Xun
Author_Institution :
Coll. of Mechatron. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
In order to evaluate lifetime of electron multiplier(EM), which is a key component of a cesium atomic frequency standard system, step stress accelerated degradation test in a two-way design is presented. The investigation of test design, establishment of lifetime evaluation model and model analyses is made. Then lifetime evaluation of EM is carried out.
Keywords :
electron multipliers; frequency standards; life testing; reliability; cesium atomic frequency standard system; electron multiplier; lifetime evaluation; step stress accelerated degradation test; two-way design; Acceleration; Atomic clocks; Automatic testing; Decision support systems; Degradation; Electron multipliers; Life estimation; Life testing; Stress; System testing; EM; double step stress accelerated degradation test (DSSADT); lifetime evaluation; reliability;
Conference_Titel :
Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4903-3
Electronic_ISBN :
978-1-4244-4905-7
DOI :
10.1109/ICRMS.2009.5270018
