Nondestructive measurement of dielectric materials using photocharge voltage

The photocharge voltage is observed for dielectric materials. This voltage appears on any solid body when light is irradiated on a sample. The potential difference is observed on various materials such as conductors, semiconductors, dielectrics, and ceramics. For dielectric materials, the magnitude of the voltage is of the order of μV. The purpose of this paper is to report the purely experimental photocharge voltage measurements for dielectric materials, including two dimensional scan of LiNbO₃ wafer, and the test structure. The photocharge voltage was generated by chopped laser and halogen lamp light