• DocumentCode
    3511675
  • Title

    Numerical analysis on the influent factors of the interface stress of 63Sn37Pb under the temperature cycle condition

  • Author

    Li, Zhi ; Jin, Hai-Jun ; Wu, Qiong ; Dai, Hui-Tao ; Zhao, Mei-Rong

  • Author_Institution
    Mech. & Electr. Eng. Dept., China Three Gorges Project Corp., Yichang, China
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    1230
  • Lastpage
    1233
  • Abstract
    To study the interface stress of 63Sn37Pb under the temperature cycle condition in the QFP package. Viscoplastic finite element model is established based on the Anand constitutive equation. These factors are discussed in this paper, and these influent factors of the interface stress are between 63Sn37Pb weld spot and backing. The results show that the loading rate have very large effect on the interface stress of the 63Sn37Pb weld spot. The greater the rate of temperature load, the greater the stress. The holding time have a certain effect on it, the longer the holding time and the higher the peak of SEQV. Also the cycle index with the increase of it, the interface stress is enlarged. But the influence to the interface stress is weakened with a gradual increase of the cycle index.
  • Keywords
    electronics packaging; finite element analysis; internal stresses; lead alloys; tin alloys; viscoplasticity; welding; 63Sn37Pb; Anand constitutive equation; QFP packaging; SnPb; cycle index; holding time; influent factors; interface stress; loading rate; quad flat pack devices; temperature cycle condition; viscoplastic finite element model; weld spot; Capacitive sensors; Electronic packaging thermal management; Electronics packaging; Finite element methods; Lead; Microelectronics; Numerical analysis; Power engineering and energy; Stress; Temperature; 63Sn37Pb; QFP; numerical simulation; temperature cycles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety, 2009. ICRMS 2009. 8th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4903-3
  • Electronic_ISBN
    978-1-4244-4905-7
  • Type

    conf

  • DOI
    10.1109/ICRMS.2009.5270041
  • Filename
    5270041