Title :
A 3.7 M-Pixel 1300-fps CMOS Image Sensor With 5.0 G-Pixel/s High-Speed Readout Circuit
Author :
Okura, Shunsuke ; Nishikido, Osamu ; Sadanaga, Yusuke ; Kosaka, Yasuhiro ; Araki, Norihiko ; Ueda, Kazuhiro ; Morishita, Fukashi
Author_Institution :
Renesas Electron. Corp., Itami, Japan
Abstract :
A 5.0 G-pixel/s readout circuit for 15.3 mm ×8.6 mm optical size, 3.7 M-pixel, 1300 fps, and digital output image sensor for industrial applications is presented. With the column parallel ADC, the speed bottleneck is the vertical analog readout. To achieve a 5.0 G-pixel/s readout rate, a high speed column readout circuit is introduced. The novel pixel readout with the slew-enhancement and the time-interleaved correlated double sampling circuit is introduced to increase the readout rate. Besides, the A/D converter with the delay-and-gray code counter and the distributed digital data transfer schemes are innovated in order to reduce the noise interference to the foreground analog signal settling. The 1 horizontal (1H) readout time is 1.0 μs.
Keywords :
CMOS image sensors; analogue-digital conversion; counting circuits; delay circuits; optical correlation; readout electronics; A/D converter; column parallel ADC; delay-and-gray code counter; digital output CMOS image sensor; distributed digital data transfer scheme; high-speed vertical analog readout circuit; industrial application; noise interference; picture size 3.7 Mpixel; slew-enhancement; time 1.9 mus; time-interleaved correlated double sampling circuit; CMOS image sensors; Clocks; Noise; Radiation detectors; Reflective binary codes; Timing; Analog-digital integrated circuits; CMOS image sensors; CMOS integrated circuits; CMOSFET circuits; circuit noise; mixed analog digital integrated circuits; sampled data circuits; switched capacitor circuits; very high speed integrated circuits;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2387201
