Title :
Calibration of a low-temperature cable-less lightpipe pyrometer on the NIST post-exposure bake test bed
Author :
Tsai, B.K. ; Kreider, K.G. ; Kimes, W.A.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD
Abstract :
The advent of the cable-less lightpipe radiation thermometer (CLRT) has resulted in a significant improvement in the accuracy of lightpipe radiation thermometer calibrations and measurements. CLRT systems show great promise in noncontact measurements by the elimination of the uncertainties caused by the long fiber optic cables and their connections and by the extension of the spectral range to handle low-temperature applications down to room temperature. A CLRT was first calibrated with the oil-bath and water-bath blackbody sources from 40degC to 180degC. Then the CLRT was compared to thin-film thermocouples and platinum resistance thermometers on a silicon wafer heated in a post-exposure bake (PEB) test bed. Comparison of the CLRT with both the blackbody and thermocouple standards provides confidence in using CLRTs and allows researchers to continue research into improving the accuracy and feasibility of applying CLRTs in semiconductor processing
Keywords :
calibration; elemental semiconductors; pyrometers; semiconductor technology; silicon; 40 to 180 degC; CLRT; NIST post-exposure bake test bed; Si; blackbody standards; cable-less lightpipe radiation thermometer; lightpipe radiation thermometer calibrations; low-temperature cable-less lightpipe pyrometer; noncontact measurements; oil-bath blackbody sources; platinum resistance thermometers; semiconductor processing; silicon wafer; thermocouple standards; thin-film thermocouples; water-bath blackbody sources; Calibration; NIST; Optical fiber cables; Optical fibers; Platinum; Semiconductor thin films; Silicon; Temperature distribution; Testing; Thermal resistance;
Conference_Titel :
Advanced Thermal Processing of Semiconductors, 2005. RTP 2005. 13th IEEE International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-9223-X
DOI :
10.1109/RTP.2005.1613709