• DocumentCode
    3512182
  • Title

    Development of an object-based equipment controller for semiconductor equipment communications

  • Author

    Deng, Jun-Yan ; Cheng, Fan-tien ; Nguyen, Kevin

  • Author_Institution
    Inst. of Manuf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1240
  • Abstract
    SEMATECH developed the CIM framework specification to facilitate the creation of an integrated, common, flexible, modular object model leading to an open, multi-supplier CIM system environment in the semiconductor industry. However: all the equipment must comply with the SEMI SECS/GEM standards to interface with the CIM framework´s machine management components. SEMI is developing an object-based equipment model (OBEM) standard to tab full advantage of the CIM framework. With OBEM, the equipment can communicate with the CIM framework directly by method invocation. This work develops OBEM-compliant object-based equipment (OBE) in the MES framework environment, such that this equipment can directly communicate with the a MES framework, without using the SECS/GEM protocol. Therefore, a systematic approach for developing this object-based system using object technology is proposed. The unified modeling language (UML) is adopted as the major tool for analyzing and developing the target system. A SECS/GEM adapter is also added on the OBE to enable the OBE to be integrated with a legacy factory which can only use SECS/GEM standards. A die bonder is used as example equipment for development demonstrations
  • Keywords
    computer integrated manufacturing; semiconductor device manufacture; telecommunication standards; CIM framework specification; SECS/GEM standards; SEMATECH; die bonder; legacy factory; machine management components; object technology; object-based equipment controller; object-based equipment model standard; semiconductor equipment communications; unified modeling language; Bonding; Communication system control; Computer integrated manufacturing; Electronics industry; Production facilities; Protocols; Semiconductor device manufacture; Semiconductor process modeling; Standards development; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 1999. IECON '99 Proceedings. The 25th Annual Conference of the IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-5735-3
  • Type

    conf

  • DOI
    10.1109/IECON.1999.819389
  • Filename
    819389