مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3512207

Title :

Author index

fYear :

2006

fDate :

6-9 March 2006

Abstract :

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on

Conference_Location :

Austin, TX, USA

Print_ISBN :

1-4244-0167-4

Type :

conf

DOI :

10.1109/ICMTS.2006.1614262

Filename :

1614262

Link To Document :