• DocumentCode
    3512568
  • Title

    Fast wavelet-based single-particle reconstruction in Cryo-EM

  • Author

    Vonesch, Cédric ; Wang, Lanhui ; Shkolnisky, Yoel ; Singer, Amit

  • Author_Institution
    Program in Appl. & Comput. Math., Princeton Univ., Princeton, NJ, USA
  • fYear
    2011
  • fDate
    March 30 2011-April 2 2011
  • Firstpage
    1950
  • Lastpage
    1953
  • Abstract
    This paper presents a novel algorithm for the 3D tomographic inversion problem that arises in single-particle electron cryomicroscopy (Cryo-EM). It is based on two key components: 1) a variational formulation that promotes sparsity in the wavelet domain and 2) the Toeplitz structure of the combined projection/back-projection operator. The first idea has proven to be very effective for the recovery of piecewise-smooth signals, which is confirmed by our numerical experiments. The second idea allows for a computationally efficient implementation of the reconstruction procedure, using only one circulant convolution per iteration.
  • Keywords
    Toeplitz matrices; biological techniques; electron microscopy; image reconstruction; inverse problems; iterative methods; low-temperature techniques; sparse matrices; wavelet transforms; 3D tomographic inversion problem; Toeplitz structure; circulant convolution per iteration; fast wavelet-based single-particle reconstruction; piecewise-smooth signals; projection-back-projection operator; single-particle electron cryomicroscopy; sparsity; wavelet domain; Fourier transforms; Image reconstruction; Kernel; Signal to noise ratio; Three dimensional displays; Tomography; 3D; Inverse problem; Toeplitz structure; electron cryo-microscopy (Cryo-EM); non-uniform FFT; one-norm regularization; projection-slice theorem; single particle reconstruction; sparsity; wavelets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2011 IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1945-7928
  • Print_ISBN
    978-1-4244-4127-3
  • Electronic_ISBN
    1945-7928
  • Type

    conf

  • DOI
    10.1109/ISBI.2011.5872791
  • Filename
    5872791