DocumentCode
3512588
Title
Ring oscillator based technique for measuring variability statistics
Author
Bhushan, Manjul ; Ketchen, Mark B. ; Polonsky, Stas ; Gattiker, Anne
Author_Institution
IBM Syst. & Technol. Group, Poughkeepsie, NY, USA
fYear
2006
fDate
6-9 March 2006
Firstpage
87
Lastpage
92
Abstract
Device parameter induced frequency variations in a dense array of nominally identical ring oscillators are measured by sequentially combining the output frequencies into a single frequency modulated signal with the statistical frequency parameters read out by a standard frequency counter. For the example described here, the ring oscillators are designed to capture random variations in MOSFET threshold voltages.
Keywords
MOSFET; feedback oscillators; MOSFET threshold voltages; frequency counter; frequency modulated signal; ring oscillator; statistical frequency parameters; variability statistics; Circuit testing; Counting circuits; Data analysis; Decoding; Delay; Frequency; MOSFET circuits; Ring oscillators; Statistics; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN
1-4244-0167-4
Type
conf
DOI
10.1109/ICMTS.2006.1614281
Filename
1614281
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